CS 27.1317 High-Intensity Radiated Fields (HIRF) protection

• ED Decision 2016/024/R found in: CS-27 Amdt 9 - Small Rotorcraft (Dec 2021)

CS 27.1317 High-Intensity Radiated Fields (HIRF) protection ED Decision 2016/024/R (a) Each electrical and electronic system that performs a function whose failure would prevent the continued safe flight and landing of the rotorcraft must be designed and installed in a way that: (1) the function is not adversely affected during and after the rotorcraft’s exposure to HIRF environment I as described in [Appendix D](#_DxCrossRefBm472493514); (2) the system automatically recovers normal operation of that function in a timely manner after the rotorcraft’s exposure to HIRF environment I as described in [Appendix D](#_DxCrossRefBm472493514) unless the system’s recovery conflicts with other operational or functional requirements of the system that would prevent continued safe flight and landing of the rotorcraft; (3) the system is not adversely affected during and after the rotorcraft’s exposure to HIRF environment II as described in [Appendix D](#_DxCrossRefBm472493514); and (4) each function required during operation under visual flight rules is not adversely affected during and after the rotorcraft’s exposure to HIRF environment III as described in [Appendix D](#_DxCrossRefBm472493514). (b) Each electrical and electronic system that performs a function whose failure would significantly reduce the capability of the rotorcraft or the ability of the flight crew to respond to an adverse operating condition must be designed and installed in a way that the system is not adversely affected when the equipment providing the function is exposed to equipment HIRF test level 1 or 2 as described in [Appendix D](#_DxCrossRefBm472493514). (c) Each electrical and electronic system that performs a function whose failure would reduce the capability of the rotorcraft or the ability of the flight crew to respond to an adverse operating condition must be designed and installed in a way that the system is not adversely affected when the equipment providing the function is exposed to equipment HIRF test level 3 as described in [Appendix D](#_DxCrossRefBm472493514). [Amdt 27/4] CS 27.1317 High-Intensity Radiated Fields (HIRF) protection ED Decision 2016/024/R (a) Each electrical and electronic system that performs a function whose failure would prevent the continued safe flight and landing of the rotorcraft must be designed and installed in a way that: (1) the function is not adversely affected during and after the rotorcraft’s exposure to HIRF environment I as described in [Appendix D](#_DxCrossRefBm8894099); (2) the system automatically recovers normal operation of that function in a timely manner after the rotorcraft’s exposure to HIRF environment I as described in [Appendix D](#_DxCrossRefBm8894099) unless the system’s recovery conflicts with other operational or functional requirements of the system that would prevent continued safe flight and landing of the rotorcraft; (3) the system is not adversely affected during and after the rotorcraft’s exposure to HIRF environment II as described in [Appendix D](#_DxCrossRefBm8894099); and (4) each function required during operation under visual flight rules is not adversely affected during and after the rotorcraft’s exposure to HIRF environment III as described in [Appendix D](#_DxCrossRefBm8894099). (b) Each electrical and electronic system that performs a function whose failure would significantly reduce the capability of the rotorcraft or the ability of the flight crew to respond to an adverse operating condition must be designed and installed in a way that the system is not adversely affected when the equipment providing the function is exposed to equipment HIRF test level 1 or 2 as described in [Appendix D](#_DxCrossRefBm8894099). (c) Each electrical and electronic system that performs a function whose failure would reduce the capability of the rotorcraft or the ability of the flight crew to respond to an adverse operating condition must be designed and installed in a way that the system is not adversely affected when the equipment providing the function is exposed to equipment HIRF test level 3 as described in [Appendix D](#_DxCrossRefBm8894099). [Amdt 27/4]